48 Pin Probe Station

This 48 Pin Probe station was designed to provide a probing cabability for large memory devices. Typically where memory devices are damaged, the probe station is equipped with enough probe heads to probe all neccesary device legs or bond pads to allow connection ot a device programmer for data extraction.

It has been used for training purposes, users have found it useful for connecting to damaged BGA devices.

This system features a co-axial XY platten control for single handed operation, with theta movement and Z adjustment. Microscope position is also fully adjustable, making this an extreemly versatile platform, suited to rework and probing of damaged devices.

This is NOT a standard wafer probe station, this is a custom designed and built solution.  Not available "off-the-shelf" from any supplier.

Many other uses are possible

Supplied fully operational, complete with New Probe Tips , probe arms, micropositioners, microscope, cold light unit and digital camera.